Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Transmission Electron Microscopy01:15

Transmission Electron Microscopy

7.5K
In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
7.5K
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

5.7K
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
5.7K
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

15.9K
The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
15.9K
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

3.0K
Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
3.0K
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

17.3K
The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
17.3K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Staging and defect-limited intercalation of FeCl<sub>3</sub> in graphite electrodes.

Nature communications·2026
Same author

Unsupervised Segmentation and Clustering Workflow for Efficient Processing of 4D-STEM and 5D-STEM Data.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
Same author

Polyolefin blends with co-continuous architectures enabled by dynamic covalent crosslinking.

Science advances·2026
Same author

Relaxing Direct Ptychography Sampling Requirements via Parallax Imaging Insights.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
Same author

Beyond Contrast Transfer: Spectral SNR as a Finite-Dose Metric for STEM Phase Retrieval.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
Same author

Strain mapping of three-dimensionally structured two-dimensional materials.

Science advances·2026
Same journal

Correction to: Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticles.

Advanced structural and chemical imaging·2019
Same journal

Optimal principal component analysis of STEM XEDS spectrum images.

Advanced structural and chemical imaging·2019
Same journal

Protein structural biology using cell-free platform from wheat germ.

Advanced structural and chemical imaging·2018
Same journal

Multiscale higher-order TV operators for L1 regularization.

Advanced structural and chemical imaging·2018
Same journal

An open-source software ecosystem for the interactive exploration of ultrafast electron scattering data.

Advanced structural and chemical imaging·2018
Same journal

Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope.

Advanced structural and chemical imaging·2018
See all related articles

Related Experiment Video

Updated: Mar 1, 2026

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
08:46

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

Published on: April 13, 2016

10.5K

A fast image simulation algorithm for scanning transmission electron microscopy.

Colin Ophus1

  • 1National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA USA.

Advanced Structural and Chemical Imaging
|May 27, 2017
PubMed
Summary
This summary is machine-generated.

A new PRISM algorithm significantly speeds up atomic resolution scanning transmission electron microscopy (STEM) image simulations. This method offers substantial computational gains for realistic sample dimensions with minimal accuracy loss.

Keywords:
Electron scatteringImage simulationScanning transmission electron microscopy

More Related Videos

Author Spotlight: A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management
10:23

Author Spotlight: A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management

Published on: June 23, 2023

3.6K
Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
08:04

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography

Published on: March 12, 2017

9.9K

Related Experiment Videos

Last Updated: Mar 1, 2026

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
08:46

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

Published on: April 13, 2016

10.5K
Author Spotlight: A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management
10:23

Author Spotlight: A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management

Published on: June 23, 2023

3.6K
Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
08:04

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography

Published on: March 12, 2017

9.9K

Area of Science:

  • Materials Science
  • Computational Physics
  • Electron Microscopy

Background:

  • Atomic resolution scanning transmission electron microscopy (STEM) simulations are computationally intensive for realistic samples.
  • Existing methods like Bloch wave and multislice algorithms have limitations in speed and accuracy.

Purpose of the Study:

  • To introduce a novel algorithm, PRISM, for accelerating STEM image simulations.
  • To combine the strengths of Bloch wave and multislice methods for improved computational efficiency.

Main Methods:

  • Developed the PRISM algorithm, integrating Bloch wave and multislice simulation techniques.
  • Utilized a Fourier interpolation factor (f) ranging from 4-20 for atomic resolution simulations.
  • Performed large-scale STEM image simulations of a crystalline nanoparticle on an amorphous carbon substrate.

Main Results:

  • PRISM achieves speedups scaling with f^4 compared to traditional multislice simulations.
  • The new algorithm demonstrates negligible loss of accuracy.
  • Successfully simulated complex, realistic sample structures.

Conclusions:

  • PRISM offers a significant advancement in computational efficiency for atomic resolution STEM imaging.
  • The method is suitable for simulating large-scale, realistic material structures.
  • This algorithm can accelerate research in materials characterization using STEM.