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Related Concept Videos

Metallic Solids02:37

Metallic Solids

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Metallic solids such as crystals of copper, aluminum, and iron are formed by metal atoms. The structure of metallic crystals is often described as a uniform distribution of atomic nuclei within a “sea” of delocalized electrons. The atoms within such a metallic solid are held together by a unique force known as metallic bonding that gives rise to many useful and varied bulk properties.
All metallic solids exhibit high thermal and electrical conductivity, metallic luster, and malleability....
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Visualizing Uniaxial-strain Manipulation of Antiferromagnetic Domains in Fe1+YTe Using a Spin-polarized Scanning Tunneling Microscope
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Atomic Scale Structural Characterization of Epitaxial (Cd,Cr)Te Magnetic Semiconductor.

Bastien Bonef1, Hervé Boukari1, Adeline Grenier1

  • 11University Grenoble Alpes,F-38000 Grenoble,France.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|June 8, 2017
PubMed
Summary

Cr-rich regions form in magnetic semiconductor Cd1-x Cr x Te layers, impacting electronic and magnetic properties for spintronics. Understanding this atomic structure is key to developing new applications.

Keywords:
atom probe tomographyclusteringdiluted magnetic semiconductorsenergy-dispersive X-ray spectroscopyscanning transmission electron microscopy

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Area of Science:

  • Materials Science
  • Solid State Physics
  • Nanotechnology

Background:

  • Understanding atomic structure is vital for magnetic semiconductor properties.
  • Spintronic applications depend on precise control of electronic and magnetic behavior.

Purpose of the Study:

  • To investigate the formation and characteristics of chromium (Cr)-rich regions in cadmium telluride (CdTe) layers.
  • To correlate the atomic-scale Cr distribution with the magnetic properties of (Cd,Cr)Te.

Main Methods:

  • Utilized energy-dispersive X-ray spectrometry (EDX) in scanning transmission electron microscopy.
  • Employed atom probe tomography (APT) for atomic-scale compositional analysis.
  • Performed statistical analysis on APT reconstructed volumes.

Main Results:

  • Observed Cr-rich regions with sizes of 6-10 nm at x=0.034, evolving to ellipsoidal shapes at x=0.083.
  • Demonstrated increased Cr aggregation with higher average Cr composition.
  • Discussed magnetic properties within a framework of inhomogeneous materials.

Conclusions:

  • Cr distribution significantly influences the electronic and magnetic properties of (Cd,Cr)Te.
  • Accurate atomic-scale quantification of Cr distribution presents challenges for EDX and APT.
  • Further research is needed to fully understand and control Cr aggregation for spintronic applications.