Advances in two photon scanning and scanless microscopy technologies for functional neural circuit imaging

Simon R Schultz1, Caroline S Copeland1, Amanda J Foust1

  • 1Center for Neurotechnology and Department of Bioengineering Imperial College London, South Kensington, LondonSW7 2AZ, UK.

Proceedings of the IEEE. Institute of Electrical and Electronics Engineers
|August 1, 2017
PubMed
Summary

Advances in neural circuit imaging technology offer new ways to study brain function. New tools and data analysis methods are crucial for interpreting complex neural activity patterns.