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Updated: Feb 23, 2026

Scanning-probe Single-electron Capacitance Spectroscopy
Published on: July 30, 2013
The effect of STM parameters on tip-enhanced Raman spectra
Natalia Martín Sabanés1, Amala Elizabeth, Jonas H K Pfisterer
1Max Planck Institute for Polymer Research, Ackermannweg 10, 55128 Mainz, Germany. martin@mpip-mainz.mpg.de domke@mpip-mainz.mpg.de.
Abstract:
In this work, we evaluate the dependence of tip-enhanced Raman (TER) spectra of a monolayer of thiophenol at a Au(111) electrode on the scanning tunneling microscope's tunneling current set-point and bias voltage parameters. We find an increase of the TER intensity upon set-point increase or bias decrease as expected from a gap-distance reduction. The relations obtained follow a theoretical model considering a simple gap-distance change when tuning the mentioned parameters. We find that the value of the bias voltage affects the TER intensity to a larger extent than the current set-point. Therefore it is advisable to work in a low-bias regime when aiming for ultrasensitive TER measurements.
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