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Fiber taper characterization by optical backscattering reflectometry.

Yu-Hung Lai, Ki Youl Yang, Myoung-Gyun Suh

|October 19, 2017

Summary

This summary is machine-generated.

Optical fiber tapers are characterized using a novel backscattering method. This technique accurately measures taper width, identifies scattering sources, and detects defects before fabrication is complete, improving nanofiber characterization.

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Area of Science:

Optical Engineering
Materials Science
Nanotechnology

Background:

Fiber tapers are crucial for measuring optical microcavity spectra.
Adiabatic width variation is essential for single spatial mode propagation in tapers.
Current methods primarily rely on spectral transmission for taper characterization.

Purpose of the Study:

To develop a backscattering model for characterizing fiber taper width versus length.
To utilize optical backscattering reflectometry for in-situ taper analysis.
To identify dominant backscattering sources and material defects.

Main Methods:

Developed a model incorporating local taper numerical aperture for backscatter collection.
Employed optical backscattering reflectometry to measure taper profiles.
Analyzed backscatter signals to delineate refractive index fluctuations and surface roughness.

Main Results:

Successfully characterized taper width versus length using backscatter measurements.
Identified specific locations of core/cladding refractive index fluctuations and surface roughness.
Detected defects like microcracks and surface contamination.
Extracted Rayleigh backscattering coefficients consistent with manufacturer data.

Conclusions:

Optical backscattering reflectometry provides comprehensive in-situ characterization of fiber tapers.
This method offers detailed information on taper geometry, material properties, and defects.
The technique is valuable for fabricating and characterizing optical fibers, including nanofibers.