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07:34
Excitation-Scanning Hyperspectral Imaging Microscopy to Efficiently Discriminate Fluorescence Signals
Published on: August 22, 2019
Efficient method to measure the spectral distortions using periodically distributed slit in hyperspectral imager
Optics Express
|October 19, 2017
Summary
A new method simplifies measuring keystone and smile distortions in imaging spectrometers. This technique rapidly calculates geometrical distortions and wavefront error (WFE) from a single image, improving hyperspectral imager alignment.
Area of Science:
- Optical Engineering
- Spectroscopy
- Image Science
Background:
- Imaging spectrometers exhibit unique geometrical distortions: keystone and smile.
- Conventional measurement methods are complex, requiring precision stages and specialized optics.
- Simultaneous measurement of wavefront error (WFE) and repeated measurements are challenging with existing techniques.
Purpose of the Study:
- To introduce a novel, simplified method for measuring keystone and smile distortions.
- To enable simultaneous measurement of WFE alongside geometrical distortions.
- To facilitate fast, repeatable measurements with minimal setup changes.
Main Methods:
- Utilized a Field Identifier (FI) tool to capture images separated by field and wavelength.
- Calculated keystone and smile distortions from a single measurement image.
- Employed a Shack-Hartmann sensor for simultaneous WFE measurement.
Main Results:
- Successfully developed a fast and repeatable method for measuring keystone and smile.
- Enabled simultaneous WFE measurement with minimal alteration to the experimental setup.
- Demonstrated the method's effectiveness in aligning a hyperspectral imager.
Conclusions:
- The proposed method overcomes limitations of conventional techniques for measuring spectrometer distortions.
- This approach offers a significant advancement in the characterization and alignment of hyperspectral imagers.
- The technique provides accurate geometrical distortion and WFE data efficiently.
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