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The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

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Using refraction in thick glass plates for optical path length modulation in low coherence interferometry.

Niklas Kröger, Jochen Schlobohm, Andreas Pösch

|October 20, 2017

Summary

This study introduces a cost-effective method for Michelson interferometers, replacing expensive piezo actuators with a rotating glass plate. This innovation allows precise optical path length adjustments using a simple stepper motor, enabling accurate measurements.

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Area of Science:

Optical Physics
Metrology
Interferometry

Background:

Standard Michelson interferometer setups require costly high-precision linear stages (e.g., piezo actuators) to vary optical path lengths.
Existing methods for optical path length modulation can be prohibitively expensive for certain applications.

Purpose of the Study:

To present an economical alternative for generating variable optical path lengths in Michelson interferometers.
To demonstrate a novel method utilizing light refraction through a rotating glass plate controlled by a stepper motor.

Main Methods:

A glass plate is rotated using a stepper motor with a high gear ratio to alter the light's path.
The relationship between the angle of rotation and the change in optical path length is mathematically derived.
An experimental setup was constructed to validate the theoretical model and assess measurement accuracy.

Main Results:

The proposed method successfully generated controlled changes in optical path length.
Experimental verification using a measurement standard yielded a reconstructed step height within 1.25% of the expected value.
The system demonstrated high accuracy comparable to traditional, more expensive methods.

Conclusions:

Refraction-based optical path length modulation using a stepper motor offers a cost-effective solution for Michelson interferometers.
This technique provides a viable and accurate alternative to expensive precision linear stages.
The method has potential applications in various optical measurement and metrology fields.