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Updated: Aug 1, 2025

Extracting Metrics for Three-dimensional Root Systems: Volume and Surface Analysis from In-soil X-ray Computed Tomography Data
Published on: April 26, 2016
Stefan Siemens1, Markus Kästner1, Eduard Reithmeier1
1Institute of Measurement and Automatic Control, Leibniz University Hannover, An der Universität 1, 30823 Garbsen, Germany.
This dataset offers detailed microtopography measurements of diverse materials and processing techniques, captured via Confocal Laser Scanning Microscopy. It enables the development of advanced surface characterization and classification algorithms for materials science applications.
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