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Updated: Feb 19, 2026

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
Published on: April 13, 2016
X-ray microtomography system for small and light samples using a flat panel detector
A B Vilar1, T M P Dos Santos1, A S Machado2
1Nuclear Engineering Program, Federal University of Rio de Janeiro, Rio de Janeiro, Brazil.
Abstract:
A low-cost system able to perform microtomography of samples such as teeth, insects, or other small materials and low atomic numbers is presented. For this, a small flat panel type sensor was used. The process of characterization of the detector is detailed, as well as its main characteristics. The electromechanical control and the software used are also described. The advantages, some limitations, and comparisons with commercial systems are presented along with some three-dimensional volumetric reconstruction of different materials that served as samples during the development of the system.
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