Total Internal Reflection Fluorescence Microscopy
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Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy VA-TIRFM
Published on: October 2, 2012
Anatoly K Khitrin1, Jonathan C Petruccelli2, Michael A Model3
11Department of Chemistry and Biochemistry,Kent State University,Kent,OH 44242,USA.
This study uses geometrical optics to explain bright-field microscopy image formation. It shows how to extract quantitative phase information from images to reconstruct object morphology.
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