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Updated: Feb 16, 2026

Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
Published on: July 6, 2011
Liana Ramiandrisoa1, Alexandre Allard1, Youssef Joumani1
1Laboratoire National de Métrologie et d'Essais (LNE), 29 Avenue Roger Hennequin, 78197 Trappes Cedex, France.
Scanning Thermal Microscopy (SThM) measurements can be biased by laser-induced probe overheating. A new SThM "dark mode" procedure minimizes this error, improving thermal property characterization.
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