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A dark mode in scanning thermal microscopy.

Liana Ramiandrisoa1, Alexandre Allard1, Youssef Joumani1

  • 1Laboratoire National de Métrologie et d'Essais (LNE), 29 Avenue Roger Hennequin, 78197 Trappes Cedex, France.

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This summary is machine-generated.

Scanning Thermal Microscopy (SThM) measurements can be biased by laser-induced probe overheating. A new SThM "dark mode" procedure minimizes this error, improving thermal property characterization.

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Area of Science:

  • Materials Science and Engineering
  • Nanotechnology
  • Thermal Physics

Background:

  • Scanning Thermal Microscopy (SThM) requires high lateral spatial resolution, driving the development of smaller probes.
  • Miniaturized SThM probes are increasingly sensitive to size effects and heat flux variations.
  • Accurate thermal management is crucial to mitigate parasitic phenomena and ensure reliable SThM measurements.

Purpose of the Study:

  • To investigate the influence of the optical detection laser on SThM measurements.
  • To quantify the bias introduced by laser-induced overheating in thermoresistive SThM probes.
  • To propose and validate a novel SThM experimental procedure for accurate thermal flux measurements.

Main Methods:

  • Utilized a Scanning Thermal Microscopy (SThM) setup based on atomic force microscopy equipment.
  • Employed thermoresistive probes (palladium from Kelvin Nanotechnology) for thermal measurements.
  • Developed and implemented a SThM 'dark mode' experimental procedure, avoiding laser illumination.

Main Results:

  • Demonstrated significant bias in SThM measurements due to laser-induced overheating of the probe.
  • Quantified errors ranging from 14% to 37% in heat flux measurements using the classical laser-on method.
  • The SThM 'dark mode' procedure effectively eliminates laser-induced thermal bias.

Conclusions:

  • Laser illumination in standard SThM setups introduces substantial errors in heat flux measurements.
  • The proposed SThM 'dark mode' offers a metrologically sound approach for accurate thermal characterization.
  • This advancement is critical for reliable analysis of sample thermal properties at the nanoscale.