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Related Concept Videos

UV–Vis Spectrometers01:14

UV–Vis Spectrometers

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The absorbance of UV and visible (UV–visible) radiations is measured using a UV–visible spectrophotometer. Deuterium lamps, which emit UV radiation, and tungsten lamps, which produce radiation in the visible region, are used as light sources in UV–visible spectrophotometers. A monochromator or prism is used for diffraction grating, i.e., to split the incoming radiation into different wavelengths. A system of slits is used to focus the desired wavelength on the sample cell.
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IR Spectrometers

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There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...
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Mass Spectrometers01:16

Mass Spectrometers

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This lesson details the instrumentation of a mass spectrometer—a physical instrument to perform mass spectrometry on analyte molecules and record the characteristic mass spectra. This is achieved via three chief functions:
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Beams01:30

Beams

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Beams are integral components of structural engineering and construction, designed to support loads applied at various points along their length. These long, straight members can be classified based on geometry, cross-section, support type, and equilibrium condition.
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Vertical Curve: Problem Solving01:23

Vertical Curve: Problem Solving

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Vertical curves provide the transition between two roadway grades, ensuring safety, comfort, and functionality. Calculating elevations at specific stations along the curve involves several systematic steps based on the curve's geometry and provided design parameters.The vertical curve is defined by its length, grades, Point of Vertical Intersection (P.V.I.) location, and P.V.I. elevation. The stations of the Point of Vertical Curvature (P.V.C.), where the curve begins, and the Point of Vertical...
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UV–Vis Spectrum01:30

UV–Vis Spectrum

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When light passes through a substance, a portion of the light is absorbed while the remaining light is reflected or transmitted. If the molecule absorbs light between the wavelengths of 180–400 nm range, the UV spectrum is obtained, and if it absorbs light in the 400–780 nm wavelength range, the visible spectrum is obtained.     
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Updated: Feb 16, 2026

High Speed Sub-GHz Spectrometer for Brillouin Scattering Analysis
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Combined VIS-IR spectrometer with vertical probe beam.

V Protopopov1

  • 1Spectrella, Rakovo 57, Moscow District 143523, Russia.

The Review of Scientific Instruments
|January 1, 2018
PubMed
Summary

A new visible-infrared spectrometer prototype offers 1 mm spatial resolution for analyzing transparent and opaque materials. Its design enables versatile sample orientation and enhanced sensitivity in reflection mode for various industrial applications.

Area of Science:

  • Spectroscopy
  • Materials Science
  • Optical Engineering

Background:

  • Spectroscopic analysis is crucial for material characterization.
  • Existing methods may have limitations in analyzing diverse sample types or orientations.
  • The semiconductor industry requires high-resolution tools for process control and failure analysis.

Purpose of the Study:

  • To design and test a prototype combined visible-infrared spectrometer.
  • To achieve high spatial resolution for detailed material analysis.
  • To develop a versatile spectroscopic tool for various industrial applications, including semiconductor analysis.

Main Methods:

  • Development of a prototype spectrometer integrating visible and infrared spectral ranges (0.4-20 μm).
  • Implementation of a vertical probe beam and a horizontal sample orientation.

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  • Testing in reflection mode to evaluate sensitivity and performance.

    • Main Results:

    • The prototype achieved a spatial resolution of 1 mm.
    • The spectrometer can analyze both visibly transparent and opaque substances.
    • It is capable of detecting buried structures and accommodates horizontal sample orientation, including semiconductor wafers.
    • Reflection mode operation demonstrated twice the sensitivity of transmission mode.

    Conclusions:

    • The developed spectrometer prototype is a versatile tool for material analysis.
    • Its capabilities are particularly relevant for the semiconductor industry and other fields requiring high-resolution, non-destructive testing.
    • The design offers enhanced sensitivity and flexibility compared to conventional methods.