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Updated: Feb 14, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

Published on: October 11, 2016

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At-wavelength optics characterisation via X-ray speckle- and grating-based unified modulated pattern analysis

Marie-Christine Zdora, Irene Zanette, Tunhe Zhou

    Optics Express
    |February 25, 2018
    PubMed
    Summary

    Unified Modulated Pattern Analysis (UMPA) offers a cost-effective method for high-sensitivity X-ray optics characterization. This technique effectively quantifies beam damage and shape errors in refractive lenses, aiding optics development.

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