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On the Origin of Extended Resolution in Kelvin Probe Force Microscopy with a Worn Tip Apex

Sergey Y Luchkin1, Keith J Stevenson1

  • 1Skolkovo Institute of Science and Technology,Nobel St. 3,Moscow 143026,Russian Federation.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|April 6, 2018
PubMed

Keywords:
AFMKPFMelectrostatic forceresolutiontip geometry

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