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Systematic-error-free wavefront measurement using an X-ray single-grating interferometer

Takato Inoue1, Satoshi Matsuyama1, Shogo Kawai1

  • 1Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan.

The Review of Scientific Instruments
|May 3, 2018
PubMed

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