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Annular dark-field scanning confocal electron microscopy studied using multislice simulations

Takumi Hamaoka1, Chih-Yu Jao1, Masaki Takeguchi1

  • 1Transmission Electron Microscopy Station, National Institute for Materials Science, Tsukuba 305-0047, Japan.

Microscopy (Oxford, England)
|May 16, 2018
PubMed

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