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Atomic Force Microscopy01:08

Atomic Force Microscopy

4.5K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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Atomic Orbitals02:44

Atomic Orbitals

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An atomic orbital represents the three-dimensional regions in an atom where an electron has the highest probability to reside. The radial distribution function indicates the total probability of finding an electron within the thin shell at a distance r from the nucleus. The atomic orbitals have distinct shapes which are determined by l, the angular momentum quantum number. The orbitals are often drawn with a boundary surface, enclosing densest regions of the cloud.
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¹³C NMR: ¹H–¹³C Decoupling01:04

¹³C NMR: ¹H–¹³C Decoupling

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The probability of having two carbon-13 atoms next to each other is negligible because of the low natural abundance of carbon-13. Consequently, peak splitting due to carbon-carbon spin-spin coupling is not observed in spectra. However, protons up to three sigma bonds away split the carbon signal according to the n+1 rule, resulting in complicated spectra.
A broadband decoupling technique is used to simplify these complex, sometimes overlapping, signals. Broadband decoupling relies on a...
1.8K
Methods of Obtaining Topography01:25

Methods of Obtaining Topography

326
Topography involves measuring and mapping land elevations, natural features, and artificial structures to create accurate representations of the terrain. Topographic surveying relies on traditional and modern methods, each with distinct advantages and limitations.Traditional Surveying Methods:Transit stadia surveys and plane table surveys were widely used traditional surveying methods. These techniques relied on instruments like theodolites and stadia rods for measuring distances and angles,...
326
The Energies of Atomic Orbitals03:21

The Energies of Atomic Orbitals

30.3K
In an atom, the negatively charged electrons are attracted to the positively charged nucleus. In a multielectron atom, electron-electron repulsions are also observed. The attractive and repulsive forces are dependent on the distance between the particles, as well as the sign and magnitude of the charges on the individual particles. When the charges on the particles are opposite, they attract each other. If both particles have the same charge, they repel each other.
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Intermolecular Forces03:13

Intermolecular Forces

71.7K
Atoms and molecules interact through bonds (or forces): intramolecular and intermolecular. The forces are electrostatic as they arise from interactions (attractive or repulsive) between charged species (permanent, partial, or temporary charges) and exist with varying strengths between ions, polar, nonpolar, and neutral molecules. The different types of intermolecular forces are ion–dipole, dipole–dipole, hydrogen bonds, and dispersion; among these, dipole–dipole, hydrogen...
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Related Experiment Video

Updated: Feb 10, 2026

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

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Ultimate Decoupling between Surface Topography and Material Functionality in Atomic Force Microscopy Using an

Sajith M Dharmasena1, Zining Yang2, Seok Kim2

  • 1Department of Mechanical and Aerospace Engineering , The Ohio State University , Columbus , Ohio 43210 , United States.

ACS Nano
|May 26, 2018
PubMed
Summary
This summary is machine-generated.

Researchers developed a new atomic force microscopy (AFM) probe to overcome signal crosstalk. This two-field AFM probe enables independent measurement of surface topography and material properties for clearer results.

Keywords:
atomic force microscopycontact resonancecontact-mode functional AFMinner-paddled microcantileverpiezoresponse force microscopy

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Physics

Background:

  • Atomic force microscopy (AFM) is crucial for nanoscale material and structural analysis.
  • Existing AFM methods struggle with crosstalk between topography and functional property measurements, leading to artifacts.
  • Accurate separation of these signals is essential for reliable nanoscale characterization.

Purpose of the Study:

  • To introduce a novel two-field AFM probe designed to eliminate crosstalk between topography and functional property measurements.
  • To enable independent and quantitative determination of material functionalities using AFM.
  • To demonstrate the broad applicability of this new probe design across various AFM techniques.

Main Methods:

  • Development of a two-field AFM probe featuring an inner-paddled cantilever.
  • Integration of two discrete pathways within the cantilever for independent signal detection.
  • Application of the probe in piezoresponse force microscopy (PFM) for validation.

Main Results:

  • The proposed two-field AFM probe successfully separates topographic and functional signals.
  • Demonstrated reliable and potentially quantitative measurement of functional properties, validated with lithium niobate and collagen.
  • Showcased the probe's potential for use in other AFM techniques like infrared spectroscopy and electrochemical strain microscopy.

Conclusions:

  • The novel two-field AFM probe effectively resolves the longstanding issue of crosstalk in AFM.
  • This design facilitates more accurate and quantitative analysis of material properties at the nanoscale.
  • The technology holds promise for advancing various AFM-based characterization methods.