Genotype by Yield*Trait (GYT) Biplot: a Novel Approach for Genotype Selection based on Multiple Traits

Genotype selection based on multiple traits is a key issue in plant breeding; it has been dependent on setting a subjective weight for each trait in index selection and a subjective truncation point for each trait in independent culling, and the weights and truncation points can be highly subjective. In this paper we proposed and demonstrated a novel approach for genotype selection based on multiple traits, the genotype by yield*trait (GYT) biplot, where "trait" can be any breeding objective other than yield; it may be an agronomic trait, a grain quality, processing quality, or nutritional quality trait, or a disease resistance. The GYT biplot ranks genotypes based on their levels in combining yield with other target traits and at the same time shows their trait profiles, i.e., their strengths and weaknesses. Compared to existing methods, this approach is graphical, objective, effective, and straightforward. Underlying the GYT biplot approach is the paradigm shift that genotypes should be evaluated by their levels in combining yield with other traits as opposed to by their levels in individual traits. An oat dataset from multi-year multi-locations trials was used to demonstrate the GYT biplot approach.