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Reactive Vapor Deposition of Conjugated Polymer Films on Arbitrary Substrates
Published on: January 17, 2018
Matthias Van Zele1, Jonathan Watté2, Jan Hasselmeyer3
1Sol-Gel Centre for Research on Inorganic Powders and Thin Film Synthesis (SCRiPTS), Department of Chemistry, Ghent University, Krijgslaan 281-S3, 9000 Ghent, Belgium. Matthias.VanZele@ugent.be.
A new toolbox combining secondary ion mass spectrometry and profilometry accurately measures transparent coating thicknesses on window films. This method is crucial for developing advanced infrared reflective window films for industrial applications.
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