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Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images

J Fatermans1,2, A J den Dekker2,3, K Müller-Caspary1

  • 1Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.

Physical Review Letters
|August 18, 2018
PubMed

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