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Biasing of Metal-Semiconductor Junctions
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Updated: Feb 6, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Jiajie Pei1, Jiong Yang2,3, Tanju Yildirim2,3
1Collaborative Innovation Center for Optoelectronic Science and Technology, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Optoelectronic Engineering, Shenzhen University, Shenzhen, 518060, P. R. China.
Two-dimensional (2D) semiconductors like transition metal dichalcogenides (TMDs) and black phosphorus (BP) are key for optoelectronics. Understanding their many-body complexes (excitons, trions) is crucial for device applications.
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