Electromagnetic Imaging of Dielectric Objects Using a Multi-Directional Search-Based Simulated Annealing

In this paper, we introduce a global optimization method that is a novel combination of the simulated annealing method and the multi-directional search algorithm. We demonstrate the use of the algorithm for a microwave-imaging system to obtain the electrical properties of objects. The proposed global optimizer significantly improves the performance and speed of the simulated annealing method by utilizing a nonlinear simplex search, starting from an initial guess, and taking effective steps in obtaining the global solution of the minimization problem. Due to the efficient performance of the proposed global optimization method, we are able to obtain the shape, location, and material properties of the target without considering any a priori information about them. The accuracy and applicability of the proposed imaging method is demonstrated with some numerical results in which two-dimensional images of multiple objects are successfully reconstructed.