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Updated: Jan 31, 2026

Correlative Light- and Electron Microscopy Using Quantum Dot Nanoparticles
Published on: August 7, 2016
Development of novel correlative light and electron microscopy linkage system using silicon nitride film
Tomohiro Haruta1, Yuta Ikeda2, Yuji Konyuba2
1Application Management Department. JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo, Japan.
Abstract:
In this study, we investigated the optical properties of a silicon nitride (SiN) film. The thin SiN film (30 nm thick) exhibited good light transmittance and little autofluorescence and could be used as a microscope slide for optical microscopy (OM). In addition, we developed a novel correlative light and electron microscopy (CLEM) that combines OM with transmission electron microscopy (TEM) using an SiN thin film. In this system, CLEM was performed by replacing a detachable retainer with a holder for TEM and an adaptor for OM. The advantage of this method is that the same specimens can be sequentially observed using suitable OM and TEM.
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