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Updated: Jan 29, 2026

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Published on: May 12, 2012
High Internal Quantum Efficiency Ultraviolet Emission from Phase-Transition Cubic GaN Integrated on Nanopatterned
Richard Liu1,2, Richard Schaller3, Chang Qiang Chen4
1Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, United States.
This study reports ultraviolet emission properties of cubic gallium nitride (c-GaN) formed via phase transition. Substrate patterning and growth conditions influence phase purity and optical characteristics, revealing insights into c-GaN photonic behavior.
Area of Science:
- Materials Science
- Solid State Physics
- Optoelectronics
Background:
- Gallium nitride (GaN) is a crucial semiconductor for optoelectronic applications.
- Cubic GaN (c-GaN) offers different properties compared to hexagonal GaN (h-GaN).
- Achieving pure c-GaN phase and understanding its optical properties are key research areas.
Purpose of the Study:
- To investigate the ultraviolet (UV) emission characteristics of cubic GaN (c-GaN) obtained through a hexagonal-to-cubic phase transition.
- To understand the influence of substrate patterning and material growth on the phase purity and optical properties of c-GaN.
- To characterize the photonic properties, including emission polarization, decay time, and quantum efficiency, of phase-transition c-GaN.
Main Methods:
- Electron backscatter diffraction (EBSD) for phase purity analysis.
- Photoluminescence (PL) and cathodoluminescence (CL) for emission characteristics.
- Raman spectroscopy to study strain.
- Time-resolved photoluminescence (TRPL) for carrier dynamics.
- Temperature-dependent CL for internal quantum efficiency (IQE) and defect analysis.
Main Results:
- Substrate patterning and growth conditions impact c-GaN phase purity and UV emission.
- Raman spectroscopy indicated tensile strain in c-GaN.
- A c-GaN band edge emission decay time of 11 ps was measured via TRPL.
- UV emissions from both hexagonal and cubic GaN phases were linearly polarized.
- Room temperature IQE of ~29% was determined for phase-transition c-GaN.
- Intrinsic and extrinsic defect energy levels were found at ~124 meV and ~344 meV.
- A radiative lifetime of 38 ps was extracted using IQE and carrier decay lifetime.
Conclusions:
- Phase-transition c-GaN exhibits distinct UV emission characteristics influenced by fabrication parameters.
- The study provides detailed insights into the photonic properties and defect landscape of c-GaN.
- Understanding these properties is crucial for optimizing c-GaN in UV optoelectronic devices.
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