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Effective protocol for realizing contamination-free X-ray reflective optics.

Haruhiko Ohashi1, Yasunori Senba1, Yoshinori Kotani1

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Surface contamination degrades X-ray optics quality. Cleaning optics and surrounding materials with synchrotron radiation prevented contamination, maintaining beam quality for over 2.5 years.

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Area of Science:

  • Materials Science
  • Optics
  • Surface Science

Background:

  • Surface contamination of reflective X-ray optics is a persistent issue, significantly degrading beam quality.
  • Understanding the sources of organic contamination is crucial for maintaining optic performance.

Purpose of the Study:

  • To identify the sources of surface contamination on reflective X-ray optics.
  • To evaluate the effectiveness of cleaning protocols in preventing contamination and preserving beam quality.

Main Methods:

  • Gas chromatography was employed to quantify total organic content on optic surfaces.
  • Synchrotron radiation cleaning was applied during the commissioning phase.

Main Results:

  • Various materials identified as potential contamination sources were found in proximity to optical elements.
  • Implementing cleaned materials and synchrotron radiation cleaning successfully prevented surface contamination.
  • The reflected intensity at the beamline remained stable for 2.5 years post-treatment.

Conclusions:

  • Source identification and mitigation through material selection and specialized cleaning are effective against X-ray optic contamination.
  • Long-term stability of X-ray beam quality can be achieved by addressing surface contamination proactively.