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Updated: Jan 28, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Effective protocol for realizing contamination-free X-ray reflective optics
Haruhiko Ohashi1, Yasunori Senba1, Yoshinori Kotani1
1Japan Synchrotron Radiation Research Institute, Koto 1-1-1, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan.
Abstract:
The surface contamination of reflective X-ray optics has long been a serious problem that degrades beam quality. We evaluated the total organic content at the surface by gas chromatography to clarify the source of contamination. We found that various materials that can become contamination sources are used around the optical elements. After covering the optics with cleaned materials and applying synchrotron radiation cleaning during commissioning, the observed reflected intensity at the beamline has not reduced for 2.5 years.
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