A high resolution extreme ultraviolet spectrometer system optimized for harmonic spectroscopy and XUV beam analysis.

Area of Science:

• Spectroscopy
• Optics
• Photonics

Background:

• Extreme ultraviolet (XUV) radiation is crucial for studying electronic structures and dynamics.
• High spectral resolution and versatility are essential for advanced XUV applications.
• Existing XUV spectrometers often lack broad spectral coverage or multiple operational modes.

Purpose of the Study:

• To present a modular XUV spectrometer system with broad spectral range and high resolution.
• To demonstrate the system's versatility through multiple operation modes.
• To validate the spectrometer's performance using XUV coherence tomography.

Main Methods:

• Development of a modular spectrometer system covering 12-41 nm (30-99 eV).
• Implementation of three operation modes: XUV beam inspection, angular spectral analysis, and imaging spectroscopy.
• Utilizing XUV coherence tomography for performance demonstration.

Main Results:

• Achieved a spectral resolution of λ/Δλ ≳ 784 ± 89 over the 12-41 nm range.
• Demonstrated versatile functionality across the three distinct operation modes.
• Successfully applied XUV coherence tomography to showcase high-performance capabilities.

Conclusions:

• The modular XUV spectrometer offers a versatile and high-resolution solution for XUV spectroscopy.
• The system is well-suited for applications in high harmonic spectroscopy and detailed XUV beam analysis.
• The demonstrated performance validates the spectrometer's utility in advanced optical research.