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Updated: Jan 27, 2026

Quantitative Hardness Measurement by Instrumented AFM-indentation
Published on: November 22, 2016
Effect of tip shape on nanomechanical properties measurements using AFM
Quang Dang Nguyen1, Koo-Hyun Chung1
1School of Mechanical Engineering, University of Ulsan, Ulsan 44610, South Korea.
Selecting the right atomic force microscopy (AFM) probe is crucial for accurate nanomechanical property measurements. This study highlights how probe tip shape and material properties influence elastic modulus determination, recommending larger tip radii for improved precision.
Area of Science:
- Materials Science
- Nanotechnology
- Surface Science
Background:
- Atomic force microscopy (AFM)-based indentation is a key technique for nanoscale mechanical characterization, complementing surface topography analysis.
- Accurate determination of nanomechanical properties relies heavily on appropriate AFM probe selection and precise interpretation of force-indentation data.
- Understanding the interaction between different AFM probe geometries and specimen surfaces is essential for reliable measurements.
Purpose of the Study:
- To evaluate the influence of different AFM probe tip geometries (spherical, flat-ended, conical) on nanomechanical property measurements.
- To provide guidance for selecting optimal AFM probes and interpreting force-indentation data for diverse materials.
- To investigate the impact of probe characteristics on the accuracy and reliability of elastic modulus determination.
Main Methods:
- Nanomechanical properties of polyacrylic acid, polyvinylidene fluoride, and styrene-butadiene rubber were measured using four distinct AFM probes.
- Probes were modeled as sphere, flat punch, and hyperboloid after characterization to determine elastic modulus via contact models.
- Force-indentation data from extension and retraction curves were analyzed, considering potential hysteresis and misalignment effects.
Main Results:
- Flat-ended tips showed susceptibility to misalignment, hindering accurate contact model application.
- Spherical and conical tips exhibited consistent hysteresis in force-indentation data, attributed to friction, leading to significant elastic modulus variations (22-100%).
- Elastic moduli derived from the mean of extension/retraction curves generally aligned with instrumented indentation results.
- A larger tip radius (∼30 nm) was recommended for accurate GPa-range elastic modulus measurements.
- The discrepancy between extension and retraction moduli increased with decreased probe stiffness ratio.
Conclusions:
- AFM probe tip geometry significantly impacts the accuracy of nanomechanical property measurements.
- Hysteresis and misalignment are critical factors affecting data interpretation and elastic modulus determination.
- Careful probe selection, particularly considering tip radius and stiffness, is vital for reliable AFM-based mechanical characterization.
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