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Novel High Holding Voltage SCR with Embedded Carrier Recombination Structure for Latch-up Immune and Robust ESD

Zhuo Wang1, Zhao Qi2, Longfei Liang1

  • 1State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 610054, Sichuan, China.

Nanoscale Research Letters
|May 30, 2019
PubMed

Keywords:
Electrostatic discharge (ESD)Holding voltage (V h)Latch-upSilicon-controlled rectifier (SCR)Transmission line pulse (TLP)

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