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Ultrafast and ultrahigh-resolution optical vector analysis using linearly frequency-modulated waveform and dechirp

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    We developed a fast and high-resolution optical vector analyzer (OVA) using a linearly frequency-modulated (LFM) waveform and dechirp processing. This method achieves 1 ns/point measurement speed and 1.6 MHz resolution for optical devices.

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    Area of Science:

    • Photonics
    • Optical Engineering
    • Signal Processing

    Background:

    • Accurate characterization of optical devices is crucial for advanced photonic systems.
    • Existing optical vector analyzers often face limitations in speed and frequency resolution.
    • Ultrafast and ultrahigh-resolution measurement techniques are needed to meet the demands of modern optical research and development.

    Purpose of the Study:

    • To propose and experimentally demonstrate an ultrafast and ultrahigh-resolution optical vector analyzer (OVA).
    • To leverage linearly frequency-modulated (LFM) waveforms and dechirp processing for enhanced performance.
    • To enable rapid and precise characterization of optical devices under test (DUT).

    Main Methods:

    • Generation of an optical LFM signal via carrier-suppressed optical single-sideband (OSSB) modulation.
    • Separation of the optical LFM signal into reference and probe paths.
    • Mixing of the reference and probe signals after passing through the DUT for dechirp operation.
    • Utilizing balanced photodetection and low-speed analog-to-digital conversion for signal acquisition.
    • Employing digital signal processing for extracting frequency responses.

    Main Results:

    • Demonstration of an LFM-based OVA with ultrafast measurement speed.
    • Achieved ultrahigh frequency resolution in characterizing an optical device.
    • Experimental results show a measurement speed of 1 ns/point.
    • Experimental results show a frequency resolution of 1.6 MHz for a narrowband tunable optical filter.

    Conclusions:

    • The proposed LFM-based OVA offers a significant advancement in measurement speed and frequency resolution.
    • The technique is suitable for high-speed characterization of optical components.
    • This approach paves the way for more efficient optical device testing and analysis.