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Novel High-Energy-Efficiency AlGaN/GaN HEMT with High Gate and Multi-Recessed Buffer.
Shunwei Zhu1, Hujun Jia2, Tao Li1
1School of Microelectronics, Xidian University, Xi'an 710071, China.
Micromachines
|July 5, 2019
Summary
A novel high-gate and multi-recessed buffer (HGMRB) AlGaN/GaN high-electron-mobility transistor (HEMT) shows improved breakdown voltage and power-added efficiency. This HGMRB HEMT offers better energy efficiency for high-power applications compared to conventional designs.
Area of Science:
- Semiconductor Device Physics
- Materials Science
- Electrical Engineering
Background:
- High-electron-mobility transistors (HEMTs) are crucial for high-frequency and high-power applications.
- Improving energy efficiency in HEMTs is essential for advanced electronic systems.
Purpose of the Study:
- To propose and investigate a novel AlGaN/GaN HEMT structure with a high gate and multi-recessed buffer (HGMRB).
- To evaluate the performance and energy efficiency of the proposed HGMRB HEMT using TCAD and RF simulations.
Main Methods:
- Technology Computer Aided Design (TCAD) Sentaurus and Advanced Design System (ADS) simulations were employed.
- A novel HGMRB AlGaN/GaN HEMT structure was designed and simulated.
- Radio frequency (RF) simulations were conducted to assess power-added efficiency (PAE).
Main Results:
- The HGMRB HEMT exhibited a 16.7% increase in breakdown voltage and a 17% decrease in gate-to-source capacitance.
- Slight decreases in maximum drain saturation current and transconductance were observed.
- High power-added efficiency (PAE) of 90.8% at 600 MHz, 89.3% at 1.2 GHz, and 84.4% at 2.4 GHz was achieved.
Conclusions:
- The proposed HGMRB HEMT structure demonstrates superior performance characteristics compared to conventional HEMTs.
- The HGMRB HEMT is a promising candidate for high energy-efficiency applications.
- The enhanced breakdown voltage and high PAE ensure large output power density for the novel device.
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