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Updated: Jan 20, 2026

Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy
Published on: August 10, 2019
Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy.
Christopher J Guérin1, Anna Kremer1, Peter Borghgraef1
1VIB Bio Imaging Core; VIB Inflammation Research Center; Department of Molecular Biomedical Research, UGent.
This protocol enables high-resolution 3D electron microscopy (EM) imaging by combining serial block face scanning EM (SBF-SEM) and focused ion beam SEM (FIB-SEM). Microwave-assisted processing significantly reduces sample preparation time from days to hours.
Area of Science:
- Cell Biology
- Microscopy Techniques
- Biotechnology
Background:
- Electron microscopy (EM) traditionally offers 2D imaging.
- Volume EM techniques like SBF-SEM and FIB-SEM enable 3D imaging.
- Current 3D EM methods have limitations in field of view or Z-axis resolution.
Purpose of the Study:
- To present a protocol for high-resolution 3D electron microscopy imaging.
- To combine SBF-SEM and FIB-SEM for comprehensive 3D analysis.
- To reduce sample preparation time for volume EM.
Main Methods:
- Serial block face scanning electron microscopy (SBF-SEM) for large fields of view.
- Focused ion beam scanning electron microscopy (FIB-SEM) for high isotropic resolution.
- Microwave-assisted tissue processing for enhanced reagent penetration and reduced preparation time.
Main Results:
- Successful integration of SBF-SEM and FIB-SEM workflows.
- Achieved high isotropic voxel resolution (≤5 nm) in targeted volumes.
- Reduced sample processing time from days to hours.
Conclusions:
- The combined SBF-SEM and FIB-SEM approach allows for efficient 3D imaging of large samples with high resolution.
- Microwave-assisted processing streamlines sample preparation for volume EM.
- This protocol enhances the capability of electron microscopy for detailed cellular and tissue analysis.
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