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A Novel Resistive Switching Identification Method through Relaxation Characteristics for Sneak-path-constrained
Ying-Chen Chen1, Chao-Cheng Lin2, Szu-Tung Hu3
1Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, TX, 78758, USA. yingchenchen@utexas.edu.
Bilayer selectorless RRAM devices show intrinsic nonlinearity, effectively suppressing sneak path currents in memory arrays. This research offers design insights for reliable, high-performance nonvolatile memory applications.
Area of Science:
- Materials Science
- Electrical Engineering
- Computer Engineering
Background:
- Resistive random access memory (RRAM) is a promising nonvolatile memory technology.
- The sneak path current (SPC) problem hinders the scalability of RRAM crossbar arrays.
- Selectorless, self-rectifying RRAM architectures are explored as a solution to SPC.
Purpose of the Study:
- To investigate the intrinsic nonlinear (NL) and relaxation characteristics of bilayer high-k/low-k stacked RRAMs.
- To evaluate the effectiveness of these bilayer RRAMs in suppressing SPC in selectorless, 1R-only configurations.
- To provide design guidance for non-uniform RRAM arrays by analyzing relaxation properties.
Main Methods:
- Fabrication and characterization of bilayer high-k/low-k stacked RRAM devices.
- Analysis of intrinsic nonlinear characteristics and their impact on SPC suppression.
- Application of activation energy (Ea) extraction methodology to study relaxation properties.
Main Results:
- Demonstrated intrinsic nonlinearity in bilayer selectorless 1R-only RRAM.
- Successfully suppressed sneak path current (SPC) without additional selector devices.
- Characterized relaxation properties and their correlation with device performance.
Conclusions:
- Bilayer selectorless RRAM exhibits inherent nonlinearity suitable for SPC mitigation.
- The study provides valuable insights into the reliability and design of RRAM arrays.
- Activation energy analysis offers a method for understanding and managing non-uniformities in RRAM applications.
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