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Updated: Jan 20, 2026

X-Ray Diffraction for Determining Atomic and Molecular Structure
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Simultaneous scanning near-field optical and X-ray diffraction microscopy for correlative nanoscale

Qian Li1, Samuel D Marks1, Sunil Bean1

  • 1Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.

Journal of Synchrotron Radiation
|September 7, 2019
PubMed
Summary

A new multimodal imaging instrument combines optical microscopy and X-ray diffraction for nanoscale material analysis. This tool reveals how material structure and optical properties are linked, demonstrated by studying a pressure-induced phase transition in samarium sulfide.

Keywords:
X-ray diffraction imaginginsulator–metal transitionsmultimodal imagingsamarium sulfidescanning near-field optical microscopyscanning probe microscopystructure–property correlations

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Physics

Background:

  • Understanding local structure-property relationships is crucial for advanced materials.
  • Simultaneous nanoscale characterization of electronic and crystallographic properties is challenging.
  • Existing techniques often lack the resolution or multimodal capabilities needed.

Purpose of the Study:

  • To report the design, implementation, and operating procedures of a novel multimodal imaging instrument.
  • To demonstrate the instrument's capability for simultaneous nanoscale characterization.
  • To investigate local structure-property relationships at the nanoscale.

Main Methods:

  • Integration of scanning near-field optical microscopy (SNOM) with nanofocused synchrotron X-ray diffraction (XRD) imaging.
  • Development of an in situ mechanical pressure application system using a scanning tip.
  • Multimodal data acquisition and correlation of optical and structural information.

Main Results:

  • Successful development and operation of a multimodal imaging instrument.
  • Demonstration of nanoscale characterization of electronic/optical properties and crystallographic structure.
  • Proof-of-principle study of the insulator-metal phase transition in samarium sulfide (SmS) under mechanical pressure.
  • Correlation of near-field optical reflectivity with heterogeneous structural transformations in SmS.

Conclusions:

  • The developed multimodal instrument enables simultaneous nanoscale characterization of optical and structural properties.
  • The instrument facilitates the investigation of local structure-property relationships.
  • This approach is effective for studying phase transitions and material transformations at the nanoscale.