Related Experiment Video
Updated: Jan 19, 2026

Femtosecond Laser Filaments for Use in Sub-Diffraction-Limited Imaging and Remote Sensing
Published on: April 25, 2019
Diffractive anisoplanatism and tracker bandwidth limitations
Abstract:
This work develops the concept of "diffractive anisoplanatism," a phenomenon that limits tracker performance for directed-energy applications by introducing differences between point-source-beacon tilt measurements and scoring-beam centroid motion. Our theoretical analysis of this phenomenon, checked against wave-optics simulations, highlights two relevant effects: diffractive conversion of phase to amplitude in the beacon light, and diffractive spreading of the scoring beam into regions outside of the geometric cone sampled by the beacon. In this work, we derive expressions for the variance and power spectral density of the differential jitter between beacon tilt and scoring-beam centroid motion. Additionally, we find a scenario-dependent frequency fS above which corrections of atmospheric tilt will increase, rather than decrease, scoring-beam centroid jitter on target. Diffractive anisoplanatism provides a fundamental-physics limit on tracker performance that should be considered alongside other practical limitations.
Related Concept Videos
06:16Femtosecond Laser Filaments for Use in Sub-Diffraction-Limited Imaging and Remote Sensing
Interference and Diffraction
Interference and Diffraction
Interference and diffraction are characteristic phenomena of waves, ranging from water waves to electromagnetic waves such as light. Interference refers to the phenomenon of when two waves of the same kind overlap to give an alternating spatial variation of large and small wave amplitude. Diffraction refers to the phenomenon of when a wave passes through an aperture or...
X-ray Diffraction
X-ray diffraction (XRD) is a technique used in materials science for determining the atomic and molecular structure of a material. This is done by irradiating a sample of the material with incident X-rays and then measuring the intensities and scattering angles of the X-rays that are scattered by the material. The intensity of the scattered X-rays are plotted as a function of the...
05:48How to Build a Dichoptic Presentation System That Includes an Eye Tracker
12:39A Methodology for Capturing Joint Visual Attention Using Mobile Eye-Trackers
