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Related Experiment Video

Updated: Jan 19, 2026

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Design for a 10 keV multi-pass transmission electron microscope.

Stewart A Koppell1, Marian Mankos2, Adam J Bowman1

  • 1Physics Department, Stanford University, 382 Via Pueblo Mall, Stanford, CA 94305, USA.

Ultramicroscopy
|September 15, 2019
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Summary

Multi-pass transmission electron microscopy (MPTEM) reduces radiation damage to sensitive samples. This technique allows for fewer images to build 3D models in cryo-electron microscopy (cryo-EM), improving imaging of challenging specimens.

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Area of Science:

  • Electron microscopy
  • Materials science
  • Biophysics

Background:

  • Radiation damage limits imaging of sensitive materials in electron microscopy.
  • Cryo-electron microscopy (cryo-EM) requires numerous projections for 3D reconstruction.
  • Imaging low-contrast and heterogeneous samples remains challenging.

Purpose of the Study:

  • To design and demonstrate a proof-of-concept multi-pass transmission electron microscope (MPTEM).
  • To reduce radiation dose to samples by increasing electron-sample interactions.
  • To enable 3D reconstruction with fewer projections for cryo-EM applications.

Main Methods:

  • Development of a 10 keV MPTEM instrument.
  • Incorporation of fast-switching gated electron mirrors for multiple electron passes.
  • Derivation of a linear approximation for the multi-pass contrast transfer function (CTF).

Main Results:

  • Successful design and implementation of a functional MPTEM.
  • Demonstrated capability for electrons to interact with the sample multiple times.
  • Developed a theoretical framework relating resolution to the number of passes.

Conclusions:

  • MPTEM offers a promising approach to mitigate radiation damage in electron microscopy.
  • The developed MPTEM design can potentially reduce imaging dose and data requirements for cryo-EM.
  • Further theoretical and experimental validation is needed to optimize MPTEM performance.