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Updated: Jan 6, 2026

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens
Published on: June 2, 2017
Computer analysis of photomicrographs provides accurate microstructural data for solid materials. For Nb-Sn superconductor wire, this revealed interconnected Nb3Sn and identified small voids as the primary cause of a short superconducting mean free path.
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