Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

At Extreme Strain Rates, Pure Metals Thermally Harden while Alloys Thermally Soften.

Physical review letters·2026
Same author

Designing for cooperative grain boundary segregation in multicomponent alloys.

Proceedings of the National Academy of Sciences of the United States of America·2025
Same author

Microscale Metal Additive Manufacturing by Solid-State Impact Bonding of Shaped Thin Films.

Small (Weinheim an der Bergstrasse, Germany)·2025
Same author

Self-consistent hardness measurements spanning eleven decades of strain rate on a single material surface.

Nature communications·2025
Same author

Multicomponent alloys designed to sinter.

Nature communications·2024
Same author

Metals strengthen with increasing temperature at extreme strain rates.

Nature·2024
Same journal

Unsupervised deep image prior for sparse-view and limited-angle electron tomography.

Ultramicroscopy·2026
Same journal

Determination of the structure of the tertiary phase in the alloy Al<sub>10</sub>Mo<sub>10</sub>Nb<sub>10</sub>Ta<sub>10</sub>Ti<sub>30</sub>Zr<sub>30</sub> using convergent beam electron diffraction.

Ultramicroscopy·2026
Same journal

Predictive drift compensation of multi-frame STEM via live scan modification.

Ultramicroscopy·2026
Same journal

Deep PACBED: Multitask analysis of PACBED images using deep neural networks.

Ultramicroscopy·2026
Same journal

Guided progressive reconstructive imaging: A new quantization-based framework for low-dose, high-throughput and real-time analytical ptychography.

Ultramicroscopy·2026
Same journal

Brightness optimization in a 200 keV DTEM source by geometry-driven aberration suppression.

Ultramicroscopy·2026
See all related articles

Related Experiment Video

Updated: Jan 4, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

14.3K

Global optimization for accurate determination of EBSD pattern centers.

Edward L Pang1, Peter M Larsen1, Christopher A Schuh1

  • 1Department of Materials Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Ave, Cambridge, MA 02139, USA.

Ultramicroscopy
|November 11, 2019
PubMed
Summary
This summary is machine-generated.

Determining accurate pattern centers in electron backscatter diffraction (EBSD) is challenging due to a "sloppy" and noisy parameter landscape. A new method combining global search and pattern averaging improves accuracy for EBSD pattern center determination.

Keywords:
CalibrationDynamical simulationEBSDGlobal optimizationPattern center

More Related Videos

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
09:13

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

14.1K
Identification of Disease-related Spatial Covariance Patterns using Neuroimaging Data
14:27

Identification of Disease-related Spatial Covariance Patterns using Neuroimaging Data

Published on: June 26, 2013

16.1K

Related Experiment Videos

Last Updated: Jan 4, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

14.3K
Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
09:13

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

14.1K
Identification of Disease-related Spatial Covariance Patterns using Neuroimaging Data
14:27

Identification of Disease-related Spatial Covariance Patterns using Neuroimaging Data

Published on: June 26, 2013

16.1K

Area of Science:

  • Materials Science
  • Crystallography
  • Electron Microscopy

Background:

  • Accurate pattern center determination is crucial for electron backscatter diffraction (EBSD) techniques.
  • Current methods face accuracy limitations due to the complex parameter landscape of EBSD patterns.

Purpose of the Study:

  • To investigate the challenges in determining accurate pattern centers in EBSD.
  • To develop and validate a robust method for precise pattern center determination.

Main Methods:

  • Quantitative analysis of the pattern center fitting parameter landscape.
  • Application of a global search algorithm combined with multi-pattern averaging.
  • Validation using simulated EBSD patterns with introduced noise and binning effects.

Main Results:

  • The parameter landscape for pattern center fitting was found to be 'sloppy' and noisy, limiting accuracy.
  • The proposed method accurately determines pattern centers in simulated data, accounting for noise and binning.
  • The method successfully detected pattern center changes in experimental, noisy, and binned EBSD data.

Conclusions:

  • A novel approach significantly enhances the accuracy of EBSD pattern center determination.
  • This method addresses critical limitations in advanced EBSD techniques.
  • The developed algorithm is available online for the scientific community.