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Microfluidic Imaging Flow Cytometry by Asymmetric-detection Time-stretch Optical Microscopy ATOM

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Optical vector analysis with attometer resolution, 90-dB dynamic range and THz bandwidth.

Ting Qing¹, Shupeng Li¹, Zhenzhou Tang¹

¹Key Laboratory of Radar Imaging and Microwave Photonics, Ministry of Education, Nanjing University of Aeronautics and Astronautics, Nanjing, 210016, China.

Nature Communications

|November 15, 2019

Summary

This summary is machine-generated.

This study introduces a novel optical vector analysis (OVA) method using an asymmetric signal generator and receiver (ASG/ASR). This technique achieves ultra-wide bandwidth, high resolution, and large dynamic range simultaneously for optical device characterization.

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Area of Science:

Optics and Photonics
Optical Metrology
Device Characterization

Background:

Optical vector analysis (OVA) is crucial for fabricating and applying advanced optical devices.
Conventional OVA methods face limitations in simultaneously achieving high resolution, dynamic range, and bandwidth.
Existing techniques often require compromises between these critical measurement parameters.

Purpose of the Study:

To develop a novel OVA method that overcomes the limitations of conventional approaches.
To achieve ultra-wide bandwidth, ultra-high resolution, and ultra-large dynamic range in OVA measurements simultaneously.
To enable precise characterization of emerging optical devices without compromising key performance metrics.

Main Methods:

Implementation of an asymmetric optical probe signal generator (ASG) and receiver (ASR).
Utilizing the ASG and ASR to mitigate measurement errors caused by modulation nonlinearity.
Leveraging wavelength-independence of ASG/ASR with N-tone optical frequency combs to expand measurement range.

Main Results:

Demonstrated OVA with a resolution of 334 Hz (2.67 attometer at 1550 nm).
Achieved an ultra-large dynamic range exceeding 90 dB.
Enabled an ultra-wide measurement range of 1.075 THz.
Successfully removed measurement errors from modulation nonlinearity.

Conclusions:

The proposed ASG/ASR-based OVA method successfully meets the demanding requirements for characterizing emerging optical devices.
This technique offers simultaneous ultra-wide bandwidth, ultra-high resolution, and ultra-large dynamic range.
The method provides a significant advancement in optical metrology, enabling precise measurements without operational complexity.