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Updated: Jan 3, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Atomistic and dynamic structural characterizations in low-dimensional materials: recent applications of in situ

He Zheng1, Fan Cao1,2, Ligong Zhao1

  • 1School of Physics and Technology, Center for Electron Microscopy, MOE Key Laboratory of Artificial Micro- and Nano-structures, and Institute for Advanced Studies, Wuhan University, Wuhan 430072, China.

Microscopy (Oxford, England)
|November 21, 2019
PubMed

Keywords:
in situ transmission electron microscopyelectron beam irradiationheatingion batterymechanical deformationmicrostructural evolution

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