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Shaping the Amplitude and Phase of Laser Beams by Using a Phase-only Spatial Light Modulator

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Single-Shot Imaging of Two-Wavelength Spatial Phase-Shifting Interferometry.

Jun Woo Jeon¹, Ki-Nam Joo¹

¹3D Optical Metrology Laboratory, Department of Photonic Engineering, Chosun University, 309 Pilmun-daero, Dong-gu, Gwangju 61452, Korea.

Sensors (Basel, Switzerland)

|November 27, 2019

Summary

This study introduces a novel single-shot 3D surface profiling method using two-wavelength interferometry and spatial phase-shifting. It accurately measures rough surfaces and overcomes common phase ambiguity issues for precise 3D measurements.

Keywords:

one shot imaging polarization pixelated camera spatial phase shifting two-wavelength interferometry

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Area of Science:

Optical Metrology
Surface Characterization
3D Imaging

Background:

Traditional phase-shifting interferometry faces limitations with 2π-ambiguity and slow measurement speeds.
Accurate 3D surface profiling is crucial for quality control and material science.

Purpose of the Study:

To develop an effective single-shot method for measuring 3D surface profiles.
To address the 2π-ambiguity problem inherent in phase-shifting interferometry.
To enable rapid and accurate surface characterization of specimens.

Main Methods:

Utilizing the two-wavelength interferometric principle.
Implementing a spatial phase-shifting technique with a polarization pixelated camera.
Calculating rough surface profiles using interference fringe visibility.
Compensating for height discontinuities via phase jumps in fine height maps.

Main Results:

Successful rapid phase measurement.
Overcame the 2π-ambiguity problem.
Validated measurement of continuously smooth surfaces and large step heights (9 μm).
Results showed good agreement with established two-wavelength interferometry.

Conclusions:

The proposed single-shot method provides an effective solution for 3D surface profiling.
The technique accurately measures complex surfaces, including rough textures and significant height variations.
This advancement offers a faster and more robust alternative to conventional interferometric methods.