Nanosecond transient thermoreflectance method for characterizing anisotropic thermal conductivity

Chao Yuan1, William M Waller1, Martin Kuball1

  • 1Center for Device Thermography and Reliability (CDTR), H. H. Wills Physics Laboratory, University of Bristol, BS8 1TL Bristol, United Kingdom.

Summary

This study introduces a nanosecond transient thermoreflectance (TTR) method to measure anisotropic thermal properties. The technique simultaneously determines out-of-plane and in-plane thermal conductivities by analyzing heat conduction at different time scales.