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Highly Monochromatic Electron Emission from Graphene/Hexagonal Boron Nitride/Si Heterostructure
Katsuhisa Murakami1,2, Tomoya Igari1,2, Kazutaka Mitsuishi3
1National Institute of Advanced Industrial Science and Technology , 1-1-1 Umezono , Tsukuba , Ibaraki 305-8568 , Japan.
ACS Applied Materials & Interfaces
|December 28, 2019
Summary
A novel graphene/hexagonal boron nitride/n-Si device achieves highly monochromatic electron emission. This planar electron emitter suppresses scattering, offering performance comparable to traditional devices.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Device Physics
Background:
- Conventional electron emission devices face challenges with energy spread and scattering.
- Graphene and hexagonal boron nitride (h-BN) offer unique electronic and insulating properties.
- Silicon (n-Si) is a widely used semiconductor substrate.
Purpose of the Study:
- To fabricate and characterize a planar electron emission device using a graphene/h-BN/n-Si heterostructure.
- To investigate the role of the h-BN layer in suppressing electron inelastic scattering.
- To evaluate the monochromaticity and current density of the developed device.
Main Methods:
- Fabrication of a planar heterostructure device comprising graphene, h-BN, and n-Si.
- Measurement of electron energy distribution and energy spread (FWHM).
- Assessment of electron emission current density.
Main Results:
- The graphene/h-BN/n-Si device demonstrated highly monochromatic electron emission with an energy spread of 0.28 eV (FWHM).
- The h-BN insulating layer significantly suppressed electron inelastic scattering.
- The device achieved a maximum emission current density of 2.4 A/cm², comparable to thermal cathodes.
Conclusions:
- The graphene/h-BN heterostructure is a promising material for advanced planar electron emission devices.
- The device enables the generation of highly monochromatic electron beams with high current density.
- This technology holds potential for applications requiring precise electron emission.

