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X-ray free-electron laser wavefront sensing using the fractional Talbot effect.

Yanwei Liu1, Matthew Seaberg1, Yiping Feng1

  • 1SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025, USA.

Journal of Synchrotron Radiation
|March 11, 2020
PubMed
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A new fractional Talbot wavefront sensor enables precise X-ray measurements at free-electron lasers. This robust tool accurately tracks beam properties, advancing X-ray instrument alignment and scientific analysis.

Area of Science:

  • Optics and Photonics
  • Particle Accelerators
  • X-ray Science

Background:

  • Wavefront sensing is crucial for X-ray free-electron lasers (XFELs) to understand laser properties, align instruments, and analyze experimental data.
  • Existing methods may have limitations in energy range or compatibility with high-power XFELs.

Purpose of the Study:

  • To develop and validate a fractional Talbot wavefront sensor for XFEL applications.
  • To demonstrate its capability for wide energy range measurements and compatibility with high-power pulses.

Main Methods:

  • Development of a fractional Talbot wavefront sensor.
  • Single-shot wavefront measurements at 500 eV, 1000 eV, and 1500 eV at the Linac Coherent Light Source.
  • Application of the sensor for mirror alignment and undulator tapering studies.
Keywords:
FELsX-ray opticsfree-electron lasersinterferometrywavefront sensing

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Main Results:

  • The sensor successfully performed measurements across a wide energy range with simplified mechanics.
  • Demonstrated high sensitivity in tracking beamline focal plane position (0.12 mm uncertainty) and source location (1 m uncertainty).
  • Enabled study of undulator tapering effects on source properties.

Conclusions:

  • The fractional Talbot wavefront sensor is a sensitive, robust, and versatile tool for XFELs.
  • It facilitates routine measurements for instrument alignment and scientific analysis.
  • Paves the way for its adoption in current and future high-brightness X-ray sources.