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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: Jun 26, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Deep Learning Enabled Strain Mapping of Single-Atom Defects in Two-Dimensional Transition Metal Dichalcogenides with

Chia-Hao Lee¹, Abid Khan², Di Luo²

¹Department of Materials Science and Engineering, University of Illinois Urbana-Champaign, Urbana, Illinois 61801, United States.

|April 4, 2020

Summary

This summary is machine-generated.

We developed a deep learning method to precisely measure atomic strain fields in 2D materials like WSe2Te2. This technique overcomes radiation damage limitations in electron microscopy, revealing defect-induced lattice changes with sub-picometer accuracy.

Keywords:

2D materials Deep learning fully convolutional network scanning transmission electron microscopy single-atom defects strain mapping

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Published on: March 24, 2019

Picometer-Precision Atomic Position Tracking through Electron Microscopy

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Last Updated: Jun 26, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Visualizing Uniaxial-strain Manipulation of Antiferromagnetic Domains in Fe1+YTe Using a Spin-polarized Scanning Tunneling Microscope

Visualizing Uniaxial-strain Manipulation of Antiferromagnetic Domains in Fe1+YTe Using a Spin-polarized Scanning Tunneling Microscope

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Picometer-Precision Atomic Position Tracking through Electron Microscopy

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

Area of Science:

Materials Science
Condensed Matter Physics
Nanotechnology

Background:

Two-dimensional (2D) materials are excellent for studying atomic defects, but radiation damage hinders electron microscopy.
Probing atomic-scale strain fields around defects is crucial for understanding material properties.

Purpose of the Study:

To develop a high-precision method for analyzing atomic-scale strain fields induced by single-atom defects in 2D materials.
To overcome limitations of electron microscopy caused by radiation damage in beam-sensitive materials.

Main Methods:

Utilized deep learning algorithms to analyze large datasets of aberration-corrected scanning transmission electron microscopy (STEM) images.
Developed a technique to generate high signal-to-noise class averages from hundreds of defect images.
Achieved sub-picometer precision in measuring 2D atomic spacings.

Main Results:

Successfully probed single-atom defects in monolayer WSe2Te2 with sub-picometer precision.
Identified complex, oscillating strain fields around selenium (Se) vacancies.
Observed alternating rings of lattice expansion and contraction induced by Se vacancies.

Conclusions:

Demonstrated the potential of computer vision and deep learning for high-precision electron microscopy of beam-sensitive 2D materials.
Revealed intricate strain field patterns around atomic defects, offering new insights into material behavior.
Paved the way for advanced characterization of defects in novel 2D materials.