Optimal similarity norm for electrical tomography based on Bregman divergence

Mingliang Ding1, Shihong Yue1, Jia Li1

  • 1School of Electrical Engineering and Automation, Tianjin University, Tianjin 300072, China.

Summary

Electrical Tomography (ET) image quality can be improved using Bregman divergence (BD) norms. This study introduces a method for selecting optimal BD norms, enhancing spatial resolution in ET imaging.

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