The Relationship Between Water Transmission Rate and Defects on the Film Based on the Defect Analysis Using
Sun Min Kim1, Hyun Chul Kim1, Chang-Yeoul Kim1
1Advanced Materials Convergence Division, Korea Institute of Ceramic Engineering and Technology (KICET), Jinju 52851, Korea.
Abstract:
The most critical issue on flexible electronics such as organic solar cell, OLED, and flexible displays, is the protection of core active materials from the degradation by water and oxygen. The water vapor transmission rate (WVTR), the main characteristics of barrier films, is closely related to defect density in inorganic layers constructed in the film. In this study, a calcein fluorescent probe is used to examine the relationship between the water vapor transmission rate (WVTR) and the defect density of the film coated the inorganic oxide layer. By using the fluorescence characteristics of calcein dye molecules, the calcein can be used for the evaluation of water vapor transmission rate. The result shows that the defect density is linearly increasing with the water vapor transmission rate of barrier films. Furthermore, it is shown that the defect density is inversely proportional to the thickness of the inorganic layer of Al₂O₃. Based on these results, it is suggested that the defect density measurement of the inorganic layer can predict the water vapor transmission rate of the barrier film.
