Recent progress in synchrotron radiation 3D-4D nano-imaging based on X-ray full-field microscopy

Area of Science:

• Materials Science
• Physics
• Imaging Technology

Background:

• Advancements in synchrotron radiation (SR) enable high-resolution X-ray imaging techniques.
• Techniques like full-field microscopy, holography, coherent diffraction imaging, and ptychography are emerging.
• Combining these with computed tomography (CT) offers potential for non-destructive 3D and 4D nano-imaging.

Purpose of the Study:

• To discuss the current status and applications of X-ray nano-tomography (nano-CT).
• To focus on nano-CT systems employing a Fresnel zone plate as an objective lens.
• To analyze the optical properties of full-field microscopy relevant to 3D tomographic imaging.

Main Methods:

• Utilizing high-flux, high-brilliance synchrotron radiation (SR).
• Employing full-field microscopy techniques for X-ray imaging.
• Implementing computed tomography (CT) for 3D reconstruction, specifically nano-CT.

Main Results:

• X-ray nano-CT based on full-field microscopy is routinely available and widely used.
• Discussion of optical properties like spatial resolution and off-axis aberration in full-field microscopy.
• Analysis of how these optical properties affect the effective field of view in 3D tomographic imaging.

Conclusions:

• X-ray nano-CT represents a powerful tool for non-destructive nano-imaging.
• Fresnel zone plate objectives are key components in current nano-CT systems.
• Understanding optical properties is crucial for optimizing spatial resolution and field of view in nano-CT.