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Reflection suppression via elastomeric films.

David B Miller, Marvin D Alim, Robert R McLeod

|July 7, 2020

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This study presents a novel method using optical absorber-doped elastomers to temporarily suppress Fresnel reflections on transparent substrates. This technique offers superior performance over anti-reflection coatings for optical metrology and microscopy applications.

Area of Science:

Optics and Photonics
Materials Science
Optical Engineering

Background:

Transparent substrates in optical metrology, recording, and microscopy are prone to detrimental backside reflections.
These reflections degrade signal-to-noise ratios, introduce artifacts, and compromise data integrity.
Conventional anti-reflection (AR) coatings are often unsuitable due to limitations in angular and spectral bandwidth coverage.

Purpose of the Study:

To develop a versatile method for temporary suppression of Fresnel reflections on transparent substrates.
To create a material solution that overcomes the spectral and angular limitations of traditional AR coatings.
To enable high-fidelity optical measurements and imaging by minimizing unwanted backside reflections.

Main Methods:

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Utilized elastomeric materials doped with specific optical absorbers.

Engineered the refractive index of the elastomer to closely match that of various transparent substrates.

Incorporated broadband or wavelength-selective optical dopants to tailor reflection suppression.

Main Results:

Achieved reflection suppression exceeding 30 dB over a spectral bandwidth greater than 500 nm.
Demonstrated performance significantly exceeding conventional AR coatings in both spectral and angular domains.
The developed elastomeric light traps are removable, reusable, and non-damaging to substrates.

Conclusions:

The described elastomeric light traps provide an effective and adaptable solution for Fresnel reflection suppression.
This method offers a significant advancement for optical metrology, microscopy, and recording applications involving transparent substrates.
The material's tunable properties and high performance open new possibilities for optical system design and data acquisition.