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Updated: Dec 14, 2025

Author Spotlight: A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management
Published on: June 23, 2023
Development of a Mach-Zehnder type electron interferometer on a 1.2-MV field-emission transmission electron
Tetsuya Akashi1, Yoshio Takahashi1, Ken Harada2
1Research & Development Group, Hitachi, Ltd., Hatoyama, Saitama 350-0395, Japan.
Abstract:
We have developed an amplitude-division type Mach-Zehnder electron interferometer (MZ-EI). The developed MZ-EI is composed of single crystals corresponding to amplitude-division beam splitters, lenses corresponding to mirrors and an objective aperture. The spacings and azimuth angles of interference fringes can be controlled by single crystal materials and their orientations and by diffraction spots selected by the objective aperture. We built the MZ-EI on a 1.2-MV field-emission transmission electron microscope and tested its performance. Results showed that interference fringes were created for various spacings and azimuth angles, which demonstrates the practicability of the MZ-EI as an amplitude-division type electron interferometer.
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