Transmission imaging on a scintillator in a scanning electron microscope

Wilco Zuidema1, Pieter Kruit1

  • 1Delft University of Technology, Mekelweg 5, 2628CD, Delft, The Netherlands.

Ultramicroscopy
|July 31, 2020
PubMed
Summary

This study presents a new transmission imaging method for multi-beam scanning electron microscopy (MBSEM). The technique optimizes electron landing energy for improved contrast-to-noise and signal-to-noise ratios in large-area EM imaging.

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